从Hong Kong供应商批发进口Spring Pogo Pin Semiconductor Test Probe Scpc028 — FOB条款

Spring Pogo Pin Semiconductor Test Probe SCPC028 Applied to IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc. This product SCPC028 we will introduce is 0.28 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 amps. The typical maximal contact resistance is about 150 milliohms. The plunger can be pressed at a distance of up to 1.05 mm. But it is better to be pressed at a distance of 0.7 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.7 mm, the loaded force is about 25 gf, which fluctuates to a tolerance. For details, please check parameters in below table. Materials (plated) Barrel: Phosphor Bronze/Gold Clad Phosphor Bronze, Au on Ni Plated Bottom Plunger: Beryllium Copper, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Electronic Specification: Current Rating: 2 amps Contact Resistance: 150 milliohms max Bandwidth: 8.5 GHz at -1dB Inductive Reactance: 1MHZ at -0.0788 uH Capacitive Reactance: 1MHZ at 0.3165 uF Specifications: Full Stroke: 1.05 mm Rated Stroke: 0.7 mm Spring Force: 25�±7 gf at load 0.7 mm Mechanical Life: about 100000 cycles Company Information: Centalic Technology Development Ltd was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

We are test probe/pin manufacturer and having more than 30 years production experience. Our products are applied to IC and In-circuit testing fields. Further, we also provide the tailor made service not only test pins but also small metal parts. For details, please check our website https://centalic.com. Centalic Technology Development Ltd. was established in 1980 as a manufacturer to provide PCB hold-drilling service to customers. Foreseeing the rapid development of PCB industry, Centalic also developed her technology and transformed to be a manufacturer of PCB bare-board testers in 1985. 30 years experiences in PCB testing industries, we have built up a solid background and technology on manufacturing Test System, Test Probes, Test Fixture and Fixture accessories for PCB and electronic assembly industries. In 1992, Centalic has expanded her production capabilities by moving to the new factory in China. As our business keeps growing, we have set up another factory in China in 1999 and sales offices in Shanghai and with the head office in Hong Kong. In 2006, the Suzhou office was set up to expand the sales network in Northern China.